CPS Failure Analysis
CPS FA Service is Available Now!!
Nano-probe technique, based on SEM platform，can be applied to measure the electrical parameters on device from source, gate, drain and ground contact.
EBAC (Electron Beam Absorbed Current) function is performed to measure open/or short on backend process
Apply EBIRCH (Electron Beam Induced Resistance Change) to isolate leakage location in nanometer